Vinh, Luu The, and Nguyen Dang Chien. “Effects of Source Doping Profile on Device Characteristics of Lateral and Vertical Tunnel Field-Effect Transistors”. <i>Vietnam Journal of Science and Technology</i> 53, no. 1 (February 27, 2015): 85–95. Accessed March 19, 2026. https://cip.vast.vn/jst/article/view/3805.